SPC for short-run multivariate autocorrelated processes

Abstract

This paper discusses the development of a multivariate control charting technique for short-run autocorrelated data manufacturing environment. The proposed approach is a combination of the multivariate residual charts for autocorrelated data and the multivariate transformation technique for i.i.d. process observations of short lengths. The proposed approach consists in fitting adequate multivariate time-series model of various process outputs and computes the residuals, transforming them into standard normal N(0, 1) data and then using standardized data as inputs to plot conventional univariate i.i.d. control charts. The objective for applying multivariate finite horizon techniques for autocorrelated processes is to allow continuous process monitoring, since all process outputs are controlled trough the use of a single control chart with constant control limits. Throughout simulated examples, it is shown that the proposed short-run process monitoring technique provides approximately similar shifts detection properties as VAR residual charts.