A fast low-power time-to-voltage converter for high luminosity collider detectors

Abstract

A novel CMOS (complementary metal oxide semiconductor) integrated circuit has been designed to measure the time interval between two digital voltage pulses. The measurement is stored as an analog voltage on a capacitor for later digitization. The targeted range of measurable times is 5-25 ns, with a resolution of 0.5 ns. An additional feature of the circuit is a storage depth of eight samples, i.e. eight consecutive time measurements can be recorded individually. Hence, the chip is a combination of a time-to-voltage converter and an analog memory.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>