Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 2012 · 10 citations · 6 references
Natural SciencesMaterials SciencePhysicsMagnetic MaterialsMaterials CharacterizationThin FilmsAtomic Force MicroscopyFerromagnetic MaterialsFerromagnetismMagnetic CharacterizationMagnetic Thin FilmsMagnetostrictive MaterialsAtomic Force Microscopy AnalysisAtomic Force Microscopy MetrologyMagnetostrictionNanocrystalline FerromagnetsNanocrystalline Magnetic MaterialsNanocrystalline Magnetostrictive MaterialsNanocrystalline Thin FilmsSoft Magnetic Thin Films
A method for direct measuring the magnetostriction of ferromagnetic films (deposited on nonmagnetic substrates) in using an atomic force microscope was suggested. In measuring the magnetostriction for films 10 [mm] in length and 0,2 [μm] in thickness, which were deposited on substrates 200 [μm] thick, the minimum measured magnetostriction magnitude is ~10 -7 . The procedure was tested for Ni and Fe films. The magnetostriction magnitudes measured for the films are comparable with those obtained by other magnetostriction-measuring methods. The effect of alloying with zirconium and nitrogen on the magnetostriction of nanocrystalline Fe films was studied.
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