Japanese Journal of Applied Physics · 1986 · 34 citations · 7 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureMaterials ChemistryMetallic MaterialsAlloysCrystal LatticeCrystallographyLattice StructuresX-ray CrystallographyX-ray DiffractionAluminium AlloysAluminum-containing AlloysAnti-phase BoundariesAntiphase BoundariesFaulted LayersHigh-resolution Electron MicroscopyLattice ModulationPowder Diffraction
One-dimensional antiphase structures with average domain sizes of non-integral multiples ( M =1.33-1.91) of the basic L l 2 cell, existing in the Al 3- x Ti 1+ x (0< x <1/3), have been studied by high-resolution electron microscopy and X-ray powder diffraction. The mixing mode of M =1 and M =2 domains is revealed and the nature of lattice modulation associated with an antiphase structure is clarified. Ti atoms and Al-rich “statistical” atoms bordering on the antiphase boundaries are displaced away from and towards the boundary, respectively. The amounts of displacement are estimated on the basis of X-ray intensities. It is revealed that the Al 2 Ti appearing in the Al 3- x Ti 1+ x contains a small amount of Ga 2 Zr-type modification in the form of faulted zones within a matrix Ga 2 Hf-type structure. The nature of displacement modulation existing in the stoichiometric Al 2 Ti is also clarified.
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<i>International Tables for X-ray Crystallography</i>
Acta Crystallographica Section B · 1976 · 14.2K citations · Full text