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Determination of thicknesses and interface roughnesses of GaAs-based and InAs/AlSb-based heterostructures by X-ray reflectometry

DOI

10

Citations

5

References

2001

Year

Olivier Durand, V. Berger, R. Bisaro, Aude Bouchier, Alfredo De Rossi, X. Marcadet, I. Prévot
Materials Science in Semiconductor Processing

References

YearCitations

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