Concepedia

Author

Aude Bouchier

Centre National de la Recherche Scientifique

Also Known As

A Bouchier, A. Bouchier, Aude Bouchier, Bouchier, A., Bouchier, Aude

53

Publications

185

Citations

8

H-Index

23

Concepts

All Affiliations

Centre National de la Recherche ScientifiqueUniversité Fédérale de Toulouse Midi-PyrénéesLaboratoire d'Analyse et d'Architecture des SystèmesCentre National d'Études Spatiales
AB

About

Aude Bouchier is an author at Centre National de la Recherche Scientifique specializing in engineering, optical properties, and photonics.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

6

6

129

2

Applied Physics

2

2

23

3

Biomedical Engineering

1

1

16

4

Electrical Engineering

1

1

10

5

Fiber Optics

1

1

11

Aude Bouchier

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6

Publications

129

Citations

6

H-Index

YearCitations

Frequency doubling of an efficient continuous wave single-mode Yb-doped fiber laser at 978 nm in a periodically-poled MgO:LiNbO3 waveguide

Aude Bouchier, Gaëlle Lucas-Leclin, Patrick Georges,

Optics Express

2005

68

Biological functionalization of massively parallel arrays of nanocantilevers using microcontact printing

S. Guillon, Sven Salomon, Florent Seichepine,

Sensors and Actuators B Chemical

2011

16

Theoretical and experimental study of the phase noise of opto-electronic oscillators based on high quality factor optical resonators

Aude Bouchier, Khaldoun Saleh, Pierre-Henri Merrer,

2010

13

High-Q optical resonators: characterization and application to stabilization of lasers and high spectral purity microwave oscillators

Olivier Llopis, Pierre-Henri Merrer, Aude Bouchier,

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

2010

11

Fiber ring resonator based opto-electronic oscillator: phase noise optimisation and thermal stability study

Khaldoun Saleh, Aude Bouchier, Pierre-Henri Merrer,

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

2011

11

Determination of thicknesses and interface roughnesses of GaAs-based and InAs/AlSb-based heterostructures by X-ray reflectometry

Olivier Durand, V. Berger, R. Bisaro,

Materials Science in Semiconductor Processing

2001

10

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