Concepedia

A study of the microstructure of a-Si:H using spectroscopic ellipsometry measurements

R. W. Collins, W. J. Biter, A. H. Clark, H. Windischmann

Thin Solid Films · 1985 · 26 citations · 22 references

DOI

Concepts

References

22

<i>Ellipsometry and Polarized Light</i>

R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations

, , +13

Interspecimen Comparison of the Refractive Index of Fused Silica*,†

Irving H. Malitson · Journal of the Optical Society of America · 1965 · 4.1K citations

, , +14

Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV

D. E. Aspnes, A. A. Studna · Physical review. B, Condensed matter · 1983 · 4K citations

, , +17

Ellipsometry and Polarized Light

L. Cox · Optica Acta International Journal of Optics · 1978 · 1.9K citations

, , +9

Optical properties of thin films

D. E. Aspnes · Thin Solid Films · 1982 · 1.6K citations

, , +14