Publication | Closed Access
Distributions of barrier heights, difference of effective contact potential, and local values of flat-band voltage in Al–SiO2–Si and poly–Si–SiO2–Si structures
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Citations
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References
2007
Year
Materials ScienceSemiconductor TechnologyElectrical EngineeringEffective Contact PotentialEngineeringSurface ScienceApplied PhysicsSemiconductor MaterialSemiconductor Device FabricationBarrier HeightsFlat-band VoltageSemiconductor Device
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