Publication | Closed Access
A Growth Analysis for Metalorganic Vapor Phase Epitaxy of GaAs
43
Citations
10
References
1988
Year
EngineeringCrystal Growth TechnologyConventional MovpeChemical DepositionSemiconductorsChemical EngineeringGrowth AnalysisMolecular Beam EpitaxyEpitaxial GrowthCompound SemiconductorMaterials ScienceMaterials EngineeringElectrical EngineeringSurface ReactionsSubstrate SurfacesSurface ScienceApplied PhysicsOptoelectronicsChemical Vapor Deposition
Metalorganic vapor phase epitaxy (MOVPE) of GaAs is analyzed using a new growth model. Surface reactions for trimethylgallium or triethylgallium adsorbed on the substrate surfaces are assumed to be the growth-rate-limiting steps. A catalytic effect is taken into account by assuming different decomposition rates for adsorbed alkyls on Ga- and As-terminated surfaces. The surface reactions are expressed in terms of reaction times and analyzed using a rate equation approach. Parameters in a rate equation are determined by fitting to the experimental results obtained by various methods: conventional MOVPE with and without laser irradiation, pulsed MOVPE, and laser atomic layer epitaxy. Good agreement between experiments and calculations in all growth methods shows the usefulness of the model.
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