Publication | Closed Access
X-ray diffraction residual stress calculation on textured La2/3Sr1/3MnO3 thin film
23
Citations
15
References
2004
Year
Materials ScienceMaterial AnalysisEngineeringApplied PhysicsStressstrain AnalysisResidual StressPhotoelasticityMechanics Of MaterialsMicrostructureThin Film Processing
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