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Dependence of Channel Mobility on the Surface Step in Orientation in Planar 6H-SiC MOSFETs
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1998
Year
Electrical EngineeringEngineeringPlanar 6H-sic MosfetsBias Temperature InstabilityPower Semiconductor DeviceChannel MobilitySurface StepSemiconductor Device FabricationMicroelectronicsSemiconductor Device
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