Study of intrinsic point defects in oxides of the perovskite family: II. Experiment

Abstract

The electrical conductivity of and perovskite-type oxides converted by vacuum annealing into states with weak and strong compensation between donors and acceptors has been measured. It was shown that the reduced samples had both shallow and comparatively deep levels which were attributed to the neutral and singly-charged oxygen vacancy, respectively. The experimentally determined activation energies are consistent with the results of the theoretical computation reported in Part I.