Study of surface/interface and bulk defect density in a-Si:H by means of photothermal deflection spectroscopy and photoconductivity - Concepedia

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Study of surface/interface and bulk defect density in a-Si:H by means of photothermal deflection spectroscopy and photoconductivity

45

Citations

8

References

1987

Year

M. Favre, H. Curtins, A. Shah

Journal of Non-Crystalline Solids

Materials ScienceEngineeringSurface ScienceApplied PhysicsDefect FormationSemiconductor MaterialSemiconductor Device FabricationPhotothermal Deflection SpectroscopySilicon On Insulator

References

	Year	Citations

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