Publication | Closed Access
Optical dispersion analysis of TiO2 thin films based on variable-angle spectroscopic ellipsometry measurements
146
Citations
18
References
1999
Year
Materials ScienceOptical MaterialsEngineeringOptical PropertiesSpectroscopySurface ScienceApplied PhysicsOptical Dispersion AnalysisThin FilmsTio2 Thin FilmsSpectroscopic PropertyThin Film Processing
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