Concepedia

Quantitative Texture Measurements on Evaporated Films

Fred Witt, R.W. Vook, M. Schwartz

Journal of Applied Physics · 1965 · 11 citations · 5 references

DOI

Concepts

Abstract

First Page

References

5

A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray Spectrometer

L. G. Schulz · Journal of Applied Physics · 1949 · 825 citations

, , +15

Preferred Orientation Determination Using a Geiger Counter X-Ray Diffraction Goniometer

B. F. Decker, David Harker · Journal of Applied Physics · 1948 · 159 citations

, , +13

Structure and Annealing Behavior of Metal Films Deposited on Substrates near 80 °K. II. Gold Films on Glass

R.W. Vook, Fred Witt · Journal of Vacuum Science and Technology · 1965 · 43 citations

, , +16

Quantitative Determination of Preferred Orientation

Robert H. Bragg, C.M. Packer · Journal of Applied Physics · 1964 · 32 citations

, , +14

Method for Obtaining Complete Quantitative Pole Figures for Flat Sheets Using One Sample and One Sample Holder

Milton Schwartz · Journal of Applied Physics · 1955 · 14 citations

, , +12