Spin accumulation created electrically in an <i>n</i>-type germanium channel using Schottky tunnel contacts

Abstract

Using high-quality Fe3Si/n+-Ge Schottky-tunnel-barrier contacts, we study spin accumulation in an n-type germanium (n-Ge) channel. In the three- or two-terminal voltage measurements with low bias current conditions at 50 K, Hanle-effect signals are clearly detected only at a forward-biased contact. These are reliable evidence for electrical detection of the spin accumulation created in the n-Ge channel. The estimated spin lifetime in n-Ge at 50 K is one order of magnitude shorter than those in n-Si reported recently. The magnitude of the spin signals cannot be explained by the commonly used spin diffusion model. We discuss a possible origin of the difference between experimental data and theoretical values.