Second-harmonic generation from silicon nanocrystals embedded in SiO2

Abstract

We present observations of optical second-harmonic generation (SHG) from silicon nanocrystals embedded in SiO2. SHG sensitivity to Si/SiO2 interface states, charge on the nanocrystals, and particle density gradients is demonstrated. SHG is proven to be a powerful noncontact nondestructive diagnosis tool for characterization of Si-nanocrystal-based devices and materials.