Measurement Science and Technology · 2006 · 50 citations · 15 references
EngineeringElectrical EngineeringMaterials ScienceAnalog ElectronicsMicroelectronicsSemiconductor DevicesDetector TechnologyNoise In Electronic DevicesNoise In Semiconductor DevicesNoise MeasurementPhotodetectorsSemiconductor DetectorsAvalanche PhotodiodesDevice Noise CharacterizationExcess NoiseNoise CharacterizationNoise In PhotodiodesPhase-sensitive DetectionPhotodiodesTransimpedance Amplifiers
We report a versatile system for measuring excess noise and multiplication in avalanche photodiodes, using a transimpedance amplifier front-end and based on phase-sensitive detection, which permits accurate measurement in the presence of a high dark current. The system, which we have used successfully on a wide variety of materials and device structures, can measure reliably the excess noise factor of devices with a capacitance of up to ∼50 pF.
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