Publication | Closed Access
A C-element Latch Scheme with Increased Transient Fault Tolerance for Asynchronous Circuits
22
Citations
13
References
2007
Year
Unknown Venue
Dual-rail Muller PipelinesVlsi DesignEngineeringComputer ArchitectureC-element Latch SchemeFault ToleranceHardware SecurityReliability EngineeringCircuit SystemFault AnalysisSystems EngineeringFault RecoveryFault-tolerant ControlTransient Fault ToleranceAsynchronous CircuitsElectrical EngineeringTransient Fault SimulationComputer EngineeringMicroelectronicsPipeline DatapathCircuit DesignCircuit ReliabilityFault Injection
A technique of constructing dual-rail muller pipelines tolerant to transient faults is proposed. The pipeline datapath is either an NCL-D or NCL-X circuit. A dedicated controller implements the error recovery protocol, which significantly improves fault tolerance with respect to the earlier rail synchronization method. A case study featuring transient fault simulation is presented.
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