Publication | Closed Access
XPS analysis of oxides
80
Citations
14
References
1988
Year
EngineeringOxidation ResistanceChemistryOptical DiagnosticsOxide MixturesElemental CharacterizationMechanical MixturesMaterials EngineeringMaterials ScienceElectrical EngineeringOxide ElectronicsXps AnalysisXps SpectroscopySurface CharacterizationNatural SciencesSpectroscopySurface ScienceMaterials CharacterizationSurface Analysis
Abstract The principal scope of this work is to explore the capacity of XPS spectroscopy in the characterization of oxides through consideration of O 1s spectra. Several examples of oxides, analysed both separately and in the form of mechanical mixtures, are reviewed. The quantitative aspects involved in the XPS analysis of oxide mixtures were studied by use of an approach based on intensity ratio measurements of the single O 1s components. Results obtained in the mixtures are utilized for establishing the presence, or otherwise, of a single oxidic phase at real interfaces of iron‐alumina systems, metallurgical coatings, and glasses.
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