On the design of combinational totally self-checking 1-out-of-3 code checkers

Abstract

The authors present the design of an 11-transistor combinational NMOS 1-out-of-3 code checker. The checker is totally self-checking (TSC) with respect to 36 faults out of a total of 58 faults defined at the NMOS switch and layout geometrical levels, and achieves the TSC goal of a checker for most of the fault sequences. The minimum fault sequences under which the TSC goal is lost are composed of at least three faults. This might be considered as a sufficient level of safety for some implementations.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>