A simple goniometer stage for the Siemens electron microscope

Abstract

A simple goniometer stage is described which can be used in the ordinary object stage of the Siemens electron microscope without changing the air lock. The specimen tilt is ±22° and the permissible object stag traverse is from ±0.4 mm to ±0.8 mm according to the shape of the pole piece. The operational principles of the goniometer can be applied to other types of electron microscopes.