Refractive Indices of ZnO, ZnS, and Several Thin-Film Insulators

Abstract

Optical constants of and near the band edges have been measured with an interference technique. Measurements on were performed on dielectric coated single crystals while those in were performed on thin films. Using a related method, we have also determined the refractive indices of insulating thin films of , , , and a glow‐discharge deposited silicone polymer. The significant features are discussed and related to the work of others.