The optical properties of a polyetherimide

Abstract

Abstract The optical properties of polyetherimide resin as described by the complex index of refraction, N = n ‐ ik, are derived by Kramers‐Kronig analysis of experimental absorption and reflectance data obtained in the range 40 μm ≥ λ ≥105 nm. Potential uses of this polymer as a printed circuit board material and as a packaging medium for microelectronic circuitry and the relevance of optical data in laser‐assisted processing schemes used in these and other applications are briefly discussed.