Concepedia

Refractive index measurements of thin films using both Brewster and m-line technique: A combined experimental setup

S. Schutzmann, M. Casalboni, F. De Matteis, P. Prosposito

Journal of Non-Crystalline Solids · 2005 · 23 citations · 10 references

DOI

Concepts

References

10

<i>Ellipsometry and Polarized Light</i>

R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations

, , +13

Ellipsometry and Polarized Light

J.P.G. Farr · Surface Technology · 1978 · 1.1K citations

, , +9

Theory of Prism–Film Coupler and Thin-Film Light Guides

P. K. Tien, R. Ulrich · Journal of the Optical Society of America · 1970 · 735 citations

, , +15

Examination of thin SiO2 films on Si using spectroscopic polarization modulation ellipsometry

G. E. Jellison · Journal of Applied Physics · 1991 · 84 citations

, , +17

Refractive index measurement of pure and Er3+-doped ZrO2–SiO2 sol–gel film by using the Brewster angle technique

Donato Luna-Moreno, F. J. Cuevas, Luis E. Regalado et al. · Optical Materials · 2002 · 49 citations

, , +17