Radiation Measurements · 2013 · 13 citations · 6 references
EngineeringElectrical EngineeringInstrumentationMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ModelingSemiconductor DetectorsSemiconductor ReliabilityComplementary Metal-oxide-semiconductor Detector SensitivityFlow Rate DependenceSemiconductor Device CharacterizationSemiconductor MetrologyVolumetric Flow Rate
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Radon measurements with a PIN photodiode
A. Martín‐Martín, J. L. Gutierrez-Villanueva, J. M. Muñoz et al. · Applied Radiation and Isotopes · 2006 · 21 citations