X-ray Rotation-Tilt-Method — First Results of a new X-ray Diffraction Technique

Abstract

That from us as X-ray Rotation-Tilt Technique (XRT Method) designated procedure principle represents a world innovation and overcomes essential disadvantages of comparable diffraction techniques known up to now. Starting from the origin and the informational content of the XRT interferences a realization of a special equipment and selected examples of some first applications are presented.