Electronics Letters · 1998 · 22 citations · 4 references
EngineeringElectrical EngineeringOptoelectronicsPhotonicsSemiconductor DevicesLaser DiodesLaser PhysicsLight-emitting DiodesPhotonic Integrated CircuitsSemiconductor LasersHigh-power Laser DiodesHigh-power Semiconductor LasersIntegrated Semiconductor LasersLaser ThresholdLateral ConfinementQuantum Well LasersSemiconductor Laser FabricationVertical-cavity Surface-emitting Lasers
1.52 µm double fused InGaAsP/AlGaAs vertical cavity surface emitting lasers with in situ built-in lateral current confinement were fabricated using a localised wafer fusion process. A threshold current of 2.5 mA at 4 V was obtained for devices with a 10 × 10 µm2 current aperture. These devices operate CW up to 30°C. The width of the dominant mode is less than 0.1 nm and the sidemode suppression ratio is 30 dB.
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Top-emitting double-fused 1.5 µm verticalcavity lasers
N.M. Margalit, K.A. Black, Yi‐Jen Chiu et al. · Electronics Letters · 1998 · 27 citations