Residual stress depth profiling in complex hard coating systems by X-ray diffraction - Concepedia

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Residual stress depth profiling in complex hard coating systems by X-ray diffraction

58

Citations

4

References

2008

Year

M. Klaus, Ch. Genzel, H. Holzschuh

Thin Solid Films

Materials ScienceTribological CoatingEngineeringX-ray DiffractionApplied PhysicsResidual Stress DepthStressstrain AnalysisMicrostructure-strength RelationshipResidual StressDepth-graded Multilayer CoatingMechanics Of MaterialsMicrostructureStructural Materials

References

	Year	Citations

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