Metal cluster complex primary ion beam source for secondary ion mass spectrometry (SIMS) - Concepedia

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Metal cluster complex primary ion beam source for secondary ion mass spectrometry (SIMS)

12

Citations

28

References

2009

Year

Yukio Fujiwara, Kouji Watanabe, Hidehiko Nonaka, Naoaki Saito, Atsushi Suzuki, Toshiyuki Fujimoto, Akira Kurokawa, Shingo Ichimura

Accelerator Mass SpectrometryNatural SciencesMass SpectrometryAnalytical ChemistryIon BeamIon Mobility SpectrometryChemistryIon EmissionIon Mobility

References

	Year	Citations

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