Journal of Applied Crystallography · 1975 · 205 citations · 0 references
Natural SciencesComputer EngineeringComputer ScienceScientific ComputingScattering AnalysisScattering ProblemsScattering TheorySmall-angle ScatteringX-ray Data AnalysisX-ray OpticsAbsorption CorrectionSmall-angle X-ray ScatteringSmall-angle X-ray Scattering Analysis
The program comprises a main program for inspection and correction of the intensity data, and a number of subroutines covering specific operations. These subroutines can be called upon in any desired sequence.