Focusing and diffraction effects in angle-resolved x-ray photoelectron spectroscopy

Abstract

We have analyzed angle-resolved x-ray photoelectron spectroscopy data and found that large intensity enhancements along internuclear axes are due to forward-direction focusing of the electron beam by an attractive potential. Away from the internuclear axes, we found secondary peaks whose intensity is dominated by a structure factor. Results of forward-direction focusing for Cu(001) are presented and a high-energy limit of the internuclear enhancement is derived.