Concepedia

Imaging of chemical reactivity and buckled dimers on Si(100)2×1 reconstructed surface with noncontact AFM

Takayuki Uchihashi, Yasuhiro Sugawara, T. Tsukamoto, T. Minobe, S. Orisaka, Takao Okada, S. Morita

Applied Surface Science · 1999 · 28 citations · 14 references

DOI

Concepts

References

14

Frequency modulation detection using high-<i>Q</i> cantilevers for enhanced force microscope sensitivity

T. R. Albrecht, Peter Grütter, Don Horne et al. · Journal of Applied Physics · 1991 · 2.4K citations

, , +16

Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

Franz J. Gießibl · Science · 1995 · 1.2K citations · Full text

, , +17

Scanning tunneling microscopy of Si(001)

Robert J. Hamers, R. M. Tromp, J. E. Demuth · Physical review. B, Condensed matter · 1986 · 851 citations

, , +17

Determination of the local electronic structure of atomic-sized defects on Si(001) by tunneling spectroscopy

Robert J. Hamers, Ulrich Köhler · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1989 · 392 citations

, , +17

Observation of 7×7 Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy

Shinichi Kitamura, Masashi Iwatsuki · Japanese Journal of Applied Physics · 1995 · 340 citations

, , +17