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Imaging of chemical reactivity and buckled dimers on Si(100)2×1 reconstructed surface with noncontact AFM

Materials ScienceSurface CharacterizationNoncontact AfmEngineeringMicroscopyScanning Probe MicroscopySurface ScienceApplied PhysicsSurface AnalysisChemical ReactivitySilicon On InsulatorSurface Reconstruction