Publication | Closed Access
Thermal effects on the forward characteristics of silicon p-i-n diodes at high pulse currents
39
Citations
5
References
1973
Year
Electrical EngineeringSemiconductor DeviceEngineeringHigh Pulse CurrentsBias Temperature InstabilityApplied PhysicsForward CharacteristicsOptoelectronicsThermal Effects
| Year | Citations | |
|---|---|---|
Page 1
Page 1