Solid-State Electronics · 1973 · 39 citations · 5 references
EngineeringElectrical EngineeringPhysicsMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice CharacterizationDevice ModelingSemiconductor Device MaterialsSemiconductor PhysicsSemiconductor ReliabilityThermal Properties Of SemiconductorsDiode Current-voltage CharacteristicsForward Bias CharacteristicsHeat Dissipation In SemiconductorsJunction BreakdownJunction Leakage CurrentP-n Junction CharacteristicsThermal EffectsThermal Load Effects
5
The Combination of Resistivities in Semiconductors
Vivian Johnson, K. Lark‐Horovitz · Physical Review · 1951 · 70 citations