Bias scheme analysis of shielded MR heads for rigid disk recording

Abstract

Biasing schemes for MR heads for use at high areal densities, O(108 bits/in.2), longitudinal recording, are reviewed. By use of the finite element analysis, a number of important design parameters are examined including the transfer function and the peak shift for each biasing scheme. We show that the roll-off peak shift and linearity characteristics are dependent on the type of bias scheme.