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Tunneling microscopy of steps on vicinal Ge(001) and Si(001) surfaces
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1988
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Materials ScienceEngineeringTunneling MicroscopyPhysicsMicroscopyMicrofabricationScanning Probe MicroscopySurface ScienceApplied PhysicsVicinal GeSurface CutSurface AnalysisSilicon On InsulatorMicroelectronicsVicinal SiSurface Reconstruction
Tunneling images of vicinal Si(001) and vicinal Ge(001) are presented. When these surfaces are cut with a tilt about [11̄0], we find that a large fraction of the steps are straight double steps. A Ge(001) surface cut with a tilt about a line deviating from [11̄0] exhibits monoatomic steps, some of which have many kinks.