Electronics Letters · 1982 · 13 citations · 3 references
Natural SciencesMaterials SciencePhysicsElectronic MaterialsMaterials CharacterizationSolid State PhysicsDielectric MaterialsDielectric PropertiesDielectric ResponseDielectricsElectrical CharacterizationInsulation MaterialsDielectric CharacterizationDielectric ConstantDielectric Constant MeasurementDielectric MeasurementIndium PhosphideInsulation Materials CharacterizationPrecisionStatic Character
Results are given on precision measurements of the relative dielectric constant of semi-insulating indium phosphide. It is concluded that the static value is within less than 0.5% of 12.55 based on a statistical average of a large number of measurements on several material samples.
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R.L. Henry, E. M. Swiggard · Journal of Electronic Materials · 1978 · 26 citations
Natural Sciences, Materials Engineering, Materials Science +3