Phase noise and spectral line shape in semiconductor lasers

Abstract

Experimental results concerning the study of phase noise in single-mode semiconductor lasers are reported, which show a strict connection between phase and intensity noise. In particular, phase-noise spectrum is found to present a sharp peak at the same peak frequency of intensity-noise spectrum, a fact which is proven to be responsible for the appearance of satellite peaks in the emission line shape. Direct measurements of the line shape, performed by means of a Fabry-Perot interferometer, are in agreement with the line shape evaluated by using phase-noise spectrum measurements.