Threshold voltage instability of a-Si:H TFTs in liquid crystal displays

Direct measurement of gap-state absorption in hydrogenated amorphous silicon by photothermal deflection spectroscopy

Warren B. Jackson, Nabil M. Amer · Physical review. B, Condensed matter · 1982 · 604 citations · Full text

Natural Sciences, Materials Science, Physics +17

Charge trapping instabilities in amorphous silicon-silicon nitride thin-film transistors

M. J. Powell · Applied Physics Letters · 1983 · 352 citations

Engineering, Electrical Engineering, Materials Science +17

Metastable Defects in Amorphous-Silicon Thin-Film Transistors

A.R. Hepburn, Jessica Marshall, C. Main et al. · Physical Review Letters · 1986 · 137 citations

Engineering, Electrical Engineering, Materials Science +14