Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1990 · 17 citations · 10 references
Natural SciencesMaterials EngineeringMaterials ScienceCondensed Matter PhysicsSurface ScienceThin FilmsSemiconductor Thin FilmsSurface PhysicsThin Film AnnealingThin Film Electrical PropertiesThin-film MaterialsAnnealing EffectsAnnealing Temperature EffectsAnnealing Time Effects
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The depth resolution of sputter profiling
H. H. Andersen · Applied Physics A · 1979 · 596 citations
d and f metal interface formation on silicon
G. Rossi · Surface Science Reports · 1987 · 191 citations
Computer simulation of atomic mixing during ion bombardment
T. Ishitani, Ryōsuke Shimizu · Applied Physics A · 1975 · 133 citations
7 × 7 Si(111)Cu interfaces: Combined LEED, AES and EELS measurements
E. Daugy, P. Mathiez, F. Salvan et al. · Surface Science · 1985 · 105 citations
Formation of noble-metal-Si(100) interfaces
M. Hanbücken, G. Le Lay · Surface Science · 1986 · 70 citations
Natural Sciences, Materials Engineering, Materials Science +10