Scanning Auger microscopy: recent progress in data analysis and instrumentation

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Vacuum · 1994 · 3.3K citations

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Electron beam damage in Auger electron spectroscopy

Carlo G. Pantano, Theodore E. Madey · Applications of Surface Science · 1981 · 248 citations

Natural Sciences, Physics, Electronic Materials +11

Parallel detection electron spectrometer using quadrupole lenses

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An electron spectrometer using a new multidetector system based on a charge-coupled imaging device

P. J. Hicks, S. Daviel, B. Wallbank et al. · Journal of Physics E Scientific Instruments · 1980 · 94 citations

Engineering, Electrical Engineering, Nuclear Engineering +17