Publication | Closed Access
Ageing of SiC JFET transistors under repetitive current limitation conditions
18
Citations
9
References
2010
Year
Electrical EngineeringEngineeringPower DeviceSic Jfet TransistorsNanoelectronicsBias Temperature InstabilityApplied PhysicsPower Semiconductor DevicePower ElectronicsSemiconductor Device
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