Soft X-Ray Emission Spectra of Light Elements. I. Li, Be, B, Al and Si

Abstract

A grazing incidence spectrometer with a concave grating of 2 m radius operating in the wavelength region from 20 Å to 1,000 Å has been constructed in order to study the electronic structure of solids. With this spectrometer, the lithium K , beryllium K , boron K , aluminum L 2,3 and silicon L 2,3 emission spectra have been measured under the condition of ultra-high vacuum and low target input. The results are considered to give the intrinsic spectral profile nearly free from influence of oxidation and contamination of the specimen. They are compared with the theoretical density-of state curves. Some of the discontinuities in the beryllium K and aluminum L 2,3 emission spectra are attributed to the Van Hove singularities in the valence band.