Determination of (n,k) for absorbing thin films using reflectance measurements

Abstract

We propose a method for determination of the complex refractive index of absorbing materials either in bulk or film geometry by measuring its reflectivity when coated with a well-characterized transparent dielectric at two specific optical thicknesses: n(1)d(1) = lambda(0)/4 and n(1)d(1) = lambda(0)/2. The complex refractive index of the sample ñ = (n,k) is calculated for the monitoring wavelength lambda(0). The selected optical thicknesses of the coating allow the calculation of its geometrical thickness, therefore the variation of ñ with wavelength in the region where the reflectivity is measured can be determined.