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Observation of rotatable stripe domain in permalloy films with oblique sputtering
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Citations
24
References
2012
Year
Critical ThicknessEngineeringRotatable Stripe DomainThin Film Process TechnologyStripe DomainOptical PropertiesEpitaxial GrowthThin Film ProcessingAnisotropic MaterialMaterials ScienceMaterials EngineeringPhysicsSd FormationMaterial AnalysisPermalloy FilmsMicrofabricationSurface ScienceApplied PhysicsThin Films
Stripe domain (SD) in obliquely sputtered permalloy films were investigated by comparing with normally sputtered ones. The critical thickness for SD formation of obliquely sputtered films was about 100 nm thinner than that of normally sputtered films. The hysteresis loops of obliquely sputtered films showed a peculiar shape. A rotation of SD towards easy axis was observed in the obliquely sputtered films, which was confirmed by permeability spectra under a bias field. The origin of the rotation could result from in-plane uniaxial anisotropy, which is induced by the shape effect of the oblique columnar growth of permalloy grains.
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