Simbol-X: x-ray baffle for stray-light reduction

G. Cusumano, M. Artale, T. Mineo, V. Teresi, Giovanni Pareschi, Vincenzo Cotroneo

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 11 citations · 5 references

Concepts

Abstract

Simbol-X, an hard X-ray mission proposed by a consortium of European laboratories, will operate on a broad energy range (0.570 keV) providing a large collecting area ( ~ 1500 cm<sup>2</sup> at 1.5 keV and ~ 450 cm<sup>2</sup> at 30 keV) and a good imaging capability over the entire energy range. Relying on two spacecrafts in a formation flight configuration, Simbol-X will use, for the first time, a 20 meters focal length X-ray concentrator with multilayers coated mirrors that efficiently focalize photons above 10 keV and enhance the sensitivity up to 70 keV. Thanks to a ray-tracing code, we simulated the Simbol-X optics performance and investigated the contamination at the focal plane caused by stray&minus;light from diffuse cosmic X-ray background. A dedicated X-ray baffle is mandatory to minimize this contamination that otherwise, would strongly affect the telescope sensitivity. In this paper we investigate different X-ray baffle designs and show their efficiency in reducing the stray&minus;light.

References

5