Publication | Closed Access
Vacancy Association of Defects in Annealed GaAs
54
Citations
9
References
1971
Year
SemiconductorsSemiconductor TechnologyElectrical EngineeringPressure DependenceEngineeringCrystalline DefectsOptoelectronic MaterialsApplied PhysicsCathodoluminescence MeasurementsDefect FormationVacancy AssociationOptoelectronic DevicesCompound SemiconductorArsenic Vapor Pressures
Cathodoluminescence measurements were performed at 5 °K on GaAs annealed from 600 to 1100 °C under controlled arsenic vapor pressures. Various energy levels of defects were observed, and their association with Ga or As vacancies were determined from the pressure dependence. The defects associated with Ga vacancies were found to become increasingly important with increasing temperatures. Fast diffusing species such as copper can be ruled out as being responsible for the observed defects.
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