Elastic Deformation of Field-Ion-Microscope Tips

Abstract

During the imaging process the specimen in a field ion microscope is subject to a stress of 105 kg/cm2. The extent to which the elastic deformation caused by this stress appears in the image of W, Ta, and Mo specimens is investigated. Depending on the tip shape one observes an increase or a decrease in local magnification. When the electric field is increased from 220 MV/cm to 450 MV/cm the change in the projection angle does not exceed ±1.5°.