Surface and Interface Analysis · 1983 · 42 citations · 2 references
Natural SciencesChemistryMaterials ScienceAnalytical ChemistryElemental AnalysisSpectroscopyElectron MicroscopyPhotoelectron SpectroscopyX-ray Photoelectron SpectroscopyX-ray SpectroscopyHigh-resolution X-ray SpectroscopyMineral Phase AnalysisMineral Phase CompositionResolutionsSpectrometer ResolutionSulphide Mineralogy
Abstract Small area XPS can be easily performed on spectrometers with hemispherical analysers, in which electron transfer from sample to analyser precedes retardation. Spatial resolutions of 250 μm diameter have been achieved on a commercial spectrometer and applied to the study of a mixed phase sulphide mineral. Determination of the position and size of the analysis area has been made by a combined SEM/SAM technique.
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