Superstructures of submonolayer indium films on silicon (111)7 surfaces

Abstract

Superstructures of submonolayer films of indium on a clean silicon (111)7 surface have been investigated using techniques of molecular-beam deposition and reflection high-energy electron diffraction. A two-dimensional phase diagram including four superstructures, 7, (3)1/2, (31)1/2, and 4×1, are presented at substrate temperatures between 300 and 600 °C.